Before being observed with a transmission electron microscope, the samples must be prepared: they need to be thin enough for the electron beam to pass through. The preparation techniques depend not only on the sample nature and morphology (degree of hardness, biological samples, etc.), but also on the type of characterization required.
Conventional methods involve thinning samples down to a few tens of nanometers. To achieve this, the PLASSMAT platform is equipped with several polishers, saws (diamond wire and disc), an inverted microscope (Olympus GX1), an ultramicrotome (Leica EM UC7), a cross section polisher (JEOL SM 09010) and a Precison Ion Polishing System (PIPS Gatan Model 691).
To know the rates and have access to our MET sample preparation instruments, please contact us by email:
© IMN – Mentions légales
Réalisation AN. Web Studio
Entrez votre recherche :
