Chemical composition analysis

Every material is made up of elements; the nature and proportion of these elements constitute a signature and influence the material’s properties. This signature, known as chemical composition, can vary from one sample to another, depending on its production process. It can also evolve within a material as a result of various phenomena: segregation at grain boundaries or on the surface, atomic diffusion under the effect of electrical, mechanical or thermal stress, interaction with light, and so on.

The PLASSMAT platform’s equipment enables us to determine the chemical composition of a sample from the centimetric scale (XRD, IR spectroscopy) to the atomic scale (TEM), and through surface analysis (XPS). Our complementary techniques enable us to determine the spatial and temporal evolution of this composition with great precision.

Main techniques

SEM & FIB microscopies

TEM microscopy

Infrared & Raman spectroscopies

XPS spectroscopy

Secondary techniques

X-ray diffraction

Solid-state nuclear magnetic resonance

Electronic paramagnetic resonance

Optical spectroscopy

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