All types of vacuum samples (except radioactive materials): powders, single crystals, metals, oxides, polymers, etc.
Standard sample holder surface of 32mm x 75mm for analysis of large numbers of samples
Option: Gas Cluster Ion Source (GCIS). Argon cluster size between 1000 atoms and 3000 atoms. Energy per Argon atom between 20eV and 1.6eV. This Ion Cannon removes pollution and creates erosion profiles.
Option: single-atom Argon erosion profile at 500 V and 4 kV
4-point electrical sample holder with room temperature heating to 400°C
Surface spectroscopically analyzed between 700 microns x 300 microns and 15 microns x 15 microns
Source X Al mono chromatic 1486.7 Ev and Ag mono Chromatic 2984.2 eV
Ultimate resolution on conductors 0.26 eV and ultimate resolution on insulators 0.68 eV
Parallel XPS imaging for semi-quantitative analysis at each image point
Source UPS He 1 and He 2
Possibility of analyzing air-sensitive samples thanks to neutral gas transfer sample holders between glove box and XPS
Basic glovebox connected to XPS
Angular analysis to characterize concentration profiles between 1 and 10 n nanometers
