All types of samples compatible with a vacuum environment (except radioactive materials): powders, single crystals, metals, oxides, polymers, and so on;
10 cm x 10 cm sample holder to analyse a large number of samples;
Analyzed surface between 700 microns x 300 microns and 27 microns x 27 microns;
Ultimate resolution on conductors 0.26 eV and ultimate resolution on insulators 0.68 eV;
Air-sensitive samples can be analyzed using a neutral gas transfer case between the glove box and the XPS spectrometer;
Option: single-atom Argon erosion profile between 500 V and 4 kV.
Other XPS instrument
Kratos Axis Ultra
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