Micro- to nanoscale characterisation

Materials science is based on the relationship between the properties, structural morphology and processing of the materials that surround us (metals, polymers, semiconductors, ceramics, composites, etc.). Beyond its crystalline structure, a material presents interesting information at the multi-scale level. Knowledge and mastery of microscopic or nanoscopic phenomena (diffusion, arrangement of atoms, recrystallization, appearance of phases, defects, etc.) is a basic prerequisite for understanding physical phenomena.

Many of the PLASSMAT platform’s instruments meet the needs of materials characterization at the micro- and nanoscale.

X-ray diffraction

Ellipsometry

SEM & FIB microscopies

TEM microscopy

AFM & STM microscopies

Profilometry

Solid-state nuclear magnetic resonance

Raman spectroscopy

XPS spectroscopy

Entrez votre recherche :