Technical specifications

Broad choice of excitation wavelengths in the visible range:

  • 457 nm (Argon);
  • 488 nm (Argon);
  • 514 nm (Argon);
  • 532 nm (solid-state semiconductor);
  • 561 nm (solid-state semiconductor);
  • 594 nm (solid-state semiconductor);
  • 660 nm (solid-state semiconductor);
  • 670-1000 nm (titanium-sapphire).
  • Liquid nitrogen-cooled CCD detector for long counting times (400 – 950 nm);
  • InGaAs detector (900 – 1700 nm);
  • High-resolution mode (triple additive mode, spectral resolution down to 0.3 cm-1);
  • Pre-monochromator mode (triple subtractive mode) for low-frequency studies or continuous changes in excitation energy;
  • Macro and Microscopy mode (target diameter between 1 and 2 microns);
  • High and low temperature measurements (nitrogen micro-cryostat from -196 to 1500°C);
  • XY positioning stage for sample mapping;
  • Polarizers.

Other infrared & Raman spectroscopies instruments

Infrared spectroscopy: Bruker Vertex 70

Dispersive UV Raman: Jobin-Yvon Labram HR

Fourier transform Raman: Bruker MultiRam

Visible Raman for mapping: Renishaw InVia reflex

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