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Bruker Vertex 70

Technical specifications

Measurement ranges:

Far IR: 50-650 cm^-1^;
Average IR: 400-4000 cm^-1^;
Near IR: 4000-12000cm^-1.

Options are available:

45° specular reflection accessory with variable angles;
Diffuse reflection accessory, microcell to work in controlled atmosphere;
Diamond or Germanium ATR (Attenuated Total Reflection), diamond ATR with heating plate (up to 300°C), multi-reflection (7) diamond ATR for liquids, variable-angle ATR;
Powder pelletizer;
Infrared polarizers for mid-IR (KRS-5) and far-IR (polyethylene).

The Bruker Vertex 70 is combined with the Hyperion 2000 microscope and its 600-12000 cm^-1 MCT detector (for an analyzed surface of a few tens of microns):

Normal specular reflection (0°);
Transmission;
Visible and infrared polarizers;
Micrometric XY positioning stage for mapping;
Micro ATR objective (Ge crystal) and grazing angle specular reflection objective;
High and low temperature measurements (nitrogen micro-cryostat: from -196 to 600°C).

In addition to the Bruker Vertex 70, the PLASSMAT platform is equipped with the Bruker IRTF ALPHA for routine analysis.

Our Raman spectroscopy instruments

Dispersive visible Raman: Jobin-Yvon T64000

Dispersive UV Raman: Jobin-Yvon Labram HR

Fourier transform Raman : Bruker MultiRam

Visible Raman dedicated to mapping : Renishaw InVia reflex

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