JEOL JSM 5800LV SEM

This scanning electron microscope is equipped with an SDD SAMx energy dispersive spectrometer. This scanning electron microscope is mainly dedicated to quantitative chemical analysis, but can also be used for all types of chemical analysis (X-ray mapping, concentration profiles, semi-quantitative analysis) and routine imaging. A detector is used to obtain cathodoluminescence images. This microscope also has a “partial vacuum” mode.