This scanning electron microscope is primarily used for routine imaging and analysis. The electron source consists of a tungsten filament inside a Wehnelt cylinder, which focuses and controls the electron beam.
Resolution | 3.5 nm at 30 kV at the optimal working distance |
Acceleration voltage | 0.2 kV to 30 kV |
Probe current | 10 pA to 1,000 nA |
Magnification | X9 to x 900,000 compared to a Polaroid reference |
Working Distance | from 0.1 mm to 50 mm |
Room Dimensions | 300 mm x 270 mm x 224 mm (H) |
Platinum Travel (5 axes) | X/Y = 100/125 mm Z = 60 mm (35 mm motorized) T = 0° to +90° continuous 360° rotation |
Variable pressure | 1 Pa to 400 Pa |
Maximum sample weight | 500 g |
The Leo 1450VP has three imaging sensors:
Detector Name | SE1 | BSE | VPSE |
Electron type | High Schools | Re-broadcasts | High Schools |
Special Features | Suitable for low magnification; Not suitable for low WD values; | Includes a gain adjustment in addition to brightness and contrast; Often requires a higher current and/or a lower scanning speed than the other two | Suitable for insulating, vacuum-sensitive, or hydrated samples |
The Leo 1450VP is equipped with an EDX (Energy-Dispersive X-ray Spectrometer) detector with the following features:
Silicon Drift crystal with a nominal active surface area of 80 mm²;
SATW Light Element Window for the detection of elements from beryllium through uranium.
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