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Home > Techniques and equipment > AFM & STM microscopies > Nanowizard II JPK Instrument AFM

Nanowizard II JPK Instruments AFM

Technical specifications

Scanner :

XY = 100 x 100 µm²;
Z = 15 µm;
Closed-loop.

and a _λinfra-red (850 nm) laser diode.

Several modes:

Contact and intermittent contact;
Force spectroscopy;
Long-distance force spectroscopy (100 µm);
Force mapping;
Nano-manipulation.

Other AFM & STM instrument

Bruker Multimode 8 Nanoscope V

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