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Home > Techniques and equipment > AFM & STM microscopies > Bruker Multimode 8 Nanoscope V

Bruker Multimode 8 Nanoscope V

Technical specifications

3 scanners:

XY = 180 x 180 µm²; Z = 5 µm
XY = 10 x 10 µm²; Z = 3.3 µm
XY = 1 x 1 µm²; Z = 0.6 µm (atomic resolution on HOPG or mica)

and a _λred laser diode.

Several modes:

Contact, intermittent contact
Force spectroscopy

Modes dedicated to the study of properties:

electrical and magnetic: EFM, MFM, KPFM, C-AFM
mechanical: Peak Force QNM

Other AFM & STM instrument

Nanowizard II JPK Instrument AFM

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