Kratos Axis Ultra

All types of samples compatible with a vacuum environment (except radioactive materials): powders, single crystals, metals, oxides, polymers, etc.;
Sample holder surface: 2 cm X 7 cm;
Analyzed surface: 700 microns x 300 microns;
Ultimate resolution on conductors: 0.28 eV and ultimate resolution on insulators: 0.68 eV ;
Possibility of manipulating temperatures from -150°C to +600°C;
Analysis under laser irradiation possible;
Air-sensitive samples can be analyzed using a neutral gas transfer case between the glove box and the XPS.

Kratos Nova

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